31 January 1994 In situ identification of high-performance thin-layer chromatography spots by fourier transform surface-enhanced Raman scattering
Author Affiliations +
Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166580
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
FT-SERS has been used to identify samples supported on high-performance thin-layer chromatography plates. The TLC plates were sprayed with colloidal silver solutions which resulted in enhancement of the FT-Raman scattering of these biologically and environmentally important compounds.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eckhardt Koglin, Eckhardt Koglin, Hella Kramer, Hella Kramer, Juergen Sawatski, Juergen Sawatski, Carolin Lehner, Carolin Lehner, Janice L. Hellman, Janice L. Hellman, } "In situ identification of high-performance thin-layer chromatography spots by fourier transform surface-enhanced Raman scattering", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166580; https://doi.org/10.1117/12.166580
PROCEEDINGS
2 PAGES


SHARE
Back to Top