31 January 1994 Infrared external reflection spectra of Langmuir-Blodgett film on silica substrate
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166751
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
Infrared reflection spectra of bilayer, Langmuir-Blodgett (L-B) films on the glass substrate were measured. Although a reflection spectrum of the substrate is the major feature of the bilayer spectrum, weak spectral features of the L-B film are overlapping. The phase and intensity of each infrared band varies by incident angle and polarization of the infrared radiation. Spectral simulations were carried out to explain the effect of incident angle and polarization on phase and intensity.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Koichi Nishikida, Koichi Nishikida, } "Infrared external reflection spectra of Langmuir-Blodgett film on silica substrate", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166751; https://doi.org/10.1117/12.166751
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