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31 January 1994 Modeling the reflectivity of silicon
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166805
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
Various theoretical models have been proposed to simulate the reflectivity of silicon. These models were extrapolated to the infrared region, where a Drude model is also evaluated.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. A. Engelbrecht "Modeling the reflectivity of silicon", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166805
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