31 January 1994 Quantitative analysis with FT-Raman: pratfalls and possibilities
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166712
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
FT-Raman and quantitative analysis are by some standards a rough mix. Scattering efficiencies of samples are dependent on a variety of factors. For example, sample morphology, homogeneity, beam geometry, sample presentation to excitation source, to name but a few, may all contribute towards scattering efficiency. Add to this the possibility for source radiation variation. These, together with the lower signal-to-noise generally available in a Raman experiment as compared with a mid-IR experiment, make the possibility of performing a satisfactory quantitative analysis with FT-Raman seem remote. However, the possibilities of FT-Raman make the goal of quantitative analysis by this technique an attractive one: ease of sample preparation, speed of data collection, non-destructive nature, and possibilities for remote analysis.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Phillip J. Stout, Phillip J. Stout, K. Krishnan, K. Krishnan, } "Quantitative analysis with FT-Raman: pratfalls and possibilities", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166712; https://doi.org/10.1117/12.166712
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