31 January 1994 Study of 2-mercapto-benzothiazole degradation/oxidation of electronic componenets by FTIR and FT-Raman
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166636
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
In the past, we had electronic devices which used Loctite 680 (an anaerobic adhesive) and Loctite Primer-T returned from the field with a whitish debris contamination. The debris, ranging from a few microns to several hundred microns (agglomerated) in diameter, had caused a serious problem in the field. The white debris turned out to be related to the Primer- T used on the electronic components. In this paper, we show how we used FT-IR and FT- Raman microscopy to identify the contaminant and the source of the contamination and to gain a better understanding on the formation of the contaminant.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederick P. Eng, Malika Carter, Charlene D. Shebib, Yoshiko Nakao, "Study of 2-mercapto-benzothiazole degradation/oxidation of electronic componenets by FTIR and FT-Raman", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166636; https://doi.org/10.1117/12.166636
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