31 January 1994 Study of 2-mercapto-benzothiazole degradation/oxidation of electronic componenets by FTIR and FT-Raman
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166636
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
In the past, we had electronic devices which used Loctite 680 (an anaerobic adhesive) and Loctite Primer-T returned from the field with a whitish debris contamination. The debris, ranging from a few microns to several hundred microns (agglomerated) in diameter, had caused a serious problem in the field. The white debris turned out to be related to the Primer- T used on the electronic components. In this paper, we show how we used FT-IR and FT- Raman microscopy to identify the contaminant and the source of the contamination and to gain a better understanding on the formation of the contaminant.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frederick P. Eng, Frederick P. Eng, Malika Carter, Malika Carter, Charlene D. Shebib, Charlene D. Shebib, Yoshiko Nakao, Yoshiko Nakao, } "Study of 2-mercapto-benzothiazole degradation/oxidation of electronic componenets by FTIR and FT-Raman", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166636; https://doi.org/10.1117/12.166636
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