31 January 1994 Surface-enhanced Raman scattering (SERS) study of C60 and C70 in evaporated films by near-infrared FT-Raman spectroscopy
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Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166755
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada
Abstract
The 1064 nm excited FT-Raman spectra have been measured for thin evaporated films of C60 and C70 on metal surface. The spectral quality strongly depends upon the metal employed, the Raman scattering intensity changes with the roughness of the metal surface, and the visible excitations did not give any detectable Raman signals. These observations suggest that the spectra were subjected to surface enhanced Raman scattering (SERS) effect.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norihisa Katayama, Norihisa Katayama, Yoshinori Miyatake, Yoshinori Miyatake, Yukihiro Ozaki, Yukihiro Ozaki, Koichi Kikuchi, Koichi Kikuchi, Yohji Achiba, Yohji Achiba, Isao Ikemoto, Isao Ikemoto, Keiji Iriyama, Keiji Iriyama, } "Surface-enhanced Raman scattering (SERS) study of C60 and C70 in evaporated films by near-infrared FT-Raman spectroscopy", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); doi: 10.1117/12.166755; https://doi.org/10.1117/12.166755
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