Paper
28 March 1994 Analysis of a proposed Compton backscatter imaging technique
James M. Hall, Barry Alan Jacoby
Author Affiliations +
Proceedings Volume 2092, Substance Detection Systems; (1994) https://doi.org/10.1117/12.171264
Event: Substance Identification Technologies, 1993, Innsbruck, Austria
Abstract
One-sided imaging techniques are currently being used in nondestructive evaluation of surfaces and shallow subsurface structures. In this work we present both analytical calculations and detailed Monte Carlo simulations aimed at assessing the capability of a proposed Compton backscattering imaging technique designed to detect and characterize voids located several centimeters below the surface of a solid.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James M. Hall and Barry Alan Jacoby "Analysis of a proposed Compton backscatter imaging technique", Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); https://doi.org/10.1117/12.171264
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