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One-sided imaging techniques are currently being used in nondestructive evaluation of surfaces and shallow subsurface structures. In this work we present both analytical calculations and detailed Monte Carlo simulations aimed at assessing the capability of a proposed Compton backscattering imaging technique designed to detect and characterize voids located several centimeters below the surface of a solid.
James M. Hall andBarry Alan Jacoby
"Analysis of a proposed Compton backscatter imaging technique", Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); https://doi.org/10.1117/12.171264
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James M. Hall, Barry Alan Jacoby, "Analysis of a proposed Compton backscatter imaging technique," Proc. SPIE 2092, Substance Detection Systems, (28 March 1994); https://doi.org/10.1117/12.171264