Translator Disclaimer
20 May 1980 Sandwich Holography For Compensation Of Rigid Body Motion And Reposition Of Large Objects
Author Affiliations +
Proceedings Volume 0210, 2nd European Congress on Optics Applied to Metrology; (1980)
Event: Optics, Photonics, and Iconics Engineering Meeting, 1979, Strasbourg, France
New possibilities for engineering uses of hologram interferometry are shown by two experiments. Sandwich holography has been used for measurements of in-plane displacement of an object. The sign of the displacement is found by tilting the sandwich hologram during reconstruction. Fringes caused by in-plane rigid body motion can be compensated for, and local displacements evaluated. It is shown that an inplane motion of more than 1 mm of the object placed at a distance of about 1 m from the plates can be compensated for and a local tilt of 1.5 x 10-3 degrees evaluated. An object, 1 m long was placed in a fixture and a recording of the object was performed on one of the plates in the sandwich pair. Then the object was removed from the fixture as well as the holographic laboratory and holes were drilled in one wall of the object in a workshop. Then the object was put back in the fixture and the second plate in, the sandwich pair was recorded. At reconstruction the influence caused by a slight reposition error was compensated for by tilting the sandwich hologram and then the deformation around the drilled holes could be studied.
© (1980) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hans Bjelkhagen "Sandwich Holography For Compensation Of Rigid Body Motion And Reposition Of Large Objects", Proc. SPIE 0210, 2nd European Congress on Optics Applied to Metrology, (20 May 1980);


50 years of holographic interferometry
Proceedings of SPIE (January 07 2015)
Inexpensive Large-Aperture Interferometer
Proceedings of SPIE (December 25 1979)
Holographic NDT--a few tricks of the trade
Proceedings of SPIE (February 15 1993)
Holographic Interferometry For Brittle Materials
Proceedings of SPIE (May 20 1980)
Holography As Measuring Tool In Science And Industry
Proceedings of SPIE (October 25 1982)

Back to Top