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22 September 1993 Characteristic calculation of contact units for temperature control
Wenxian Chen, Yanzhou Zhou, Xiu-Zhen Jiang
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156440
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
The article studies the use of temperaturecontrolling unit which can control temperature changes and separately calculates the contact force between two contactors and temperature controlling characteristics.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Wenxian Chen, Yanzhou Zhou, and Xiu-Zhen Jiang "Characteristic calculation of contact units for temperature control", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156440
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KEYWORDS
Time division multiplexing
Temperature metrology
Resistance
Mechanics
Silicon
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