22 September 1993 Control and self-diagnosis in uP-based measurement systems
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156452
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
This paper describes a new conception about self-diagnosis organization in the common structure in micro-processor (pP) based distributed systems. The article considers supplementary functions of typical supervisor programme and creates formal method for generating and accumulating of diagnostic information in regime of real time. The examined topic are self-removing short-lived random errors whose character is little continuation (parts of second). In extremal conditions namely for them (errors) is most probably to exchange into stable ones. It''s given a possibility for investigating the frequency of their appearance in connection with the external environmental factors.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ivan Kalchev, "Control and self-diagnosis in uP-based measurement systems", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156452; https://doi.org/10.1117/12.156452
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