22 September 1993 Electrical impedance imaging for prediction of interfacial area density in two-phase flow
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156476
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
Work described in this paper represents the progress toward the development of electrical impedance imaging (Eli) sometimes called electrical computed tomography (EICT) which may ultimately be utilized for nonintrusive determination of interfecial structure and evolution in two phase flows.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
O. C. Jones, O. C. Jones, M. Kemal Kiymik, M. Kemal Kiymik, H. Riza Ozcalik, H. Riza Ozcalik, Jen Tai Lin, Jen Tai Lin, } "Electrical impedance imaging for prediction of interfacial area density in two-phase flow", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156476; https://doi.org/10.1117/12.156476
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