Paper
22 September 1993 High-precision laser interferometer for length metrology
Jiajing Pi, Li-Zhuan Zhao, Jian-Guo Du, Wei-Guo Shen
Author Affiliations +
Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156509
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
The instrument of type JLY-100 is a standing laser interferometer the wavelength of He-20Ne frequency stabilized laser is used as the standard of length metrology. The temperatures of environment and measurand are measured by a crystal thermometer. The measuring results affected by the environmental parameters can be automatically corrected by a microprocessor. The measuring range of instrument is 0-100 mm. The absolute measuring error is +O. 5L)tm where L is the length of the measurand in meter and the relative accuracy is y 1 x 106.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiajing Pi, Li-Zhuan Zhao, Jian-Guo Du, and Wei-Guo Shen "High-precision laser interferometer for length metrology", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156509
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KEYWORDS
Metrology

Laser metrology

Environmental sensing

Interferometers

Laser stabilization

Temperature metrology

Refractive index

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