22 September 1993 Mathematical analysis and parameter determination of feedback-control system for the scanning tunneling microscope
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993); doi: 10.1117/12.156289
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
This paper presents the mathematical analysis and parameter determination of feedback control system for a scanning tunneling microscope. We can obtain the frequency characteristics and transient response of a STM assembly for a tube scanner by its response to sine wave and square wave stimuli. In this way the optimum feedback parameters for the critically damped response can be determined. The design of the appropriate control electronics of a practical instrument is described too.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hong-Hai Zhang, Shang-Ping Li, Gui-Jing Sun, Hanming Shi, Ri-Yao Chen, "Mathematical analysis and parameter determination of feedback-control system for the scanning tunneling microscope", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156289; https://doi.org/10.1117/12.156289
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KEYWORDS
Scanning tunneling microscopy

Control systems

Amplifiers

Feedback control

Mathematics

Process control

Control systems design

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