22 September 1993 New method for sampling inspection by variables under undesirable measurement conditions
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156501
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
This paper presents a new approach to modify the traditional method for sampling inspection by variables to suit undesired measurement conditions. On the basis of a systematic analysis of the effects of measurement errors on different types of acceptance schemes this paper gives two modified equations for revising the sampling size ii and the acceptability constant k to form a new acceptance scheme (n'' k'') under undesired measurement conditions. It has proved that the new method is suitable to different types of sampling inspection by variables including that for mean value and that for percent defective. The new acceptance scheme based on the method presented in this paper provides an engineering feasibility to replace the traditional scheme to suit undesired measurement conditions. KEY WARDS: Sampling Inspection by Variables Measurement Errors Acceptance Scheme Sample Size Acceptability Constant.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu Zhang, Yu Zhang, X. D. Fang, X. D. Fang, } "New method for sampling inspection by variables under undesirable measurement conditions", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156501; https://doi.org/10.1117/12.156501
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