22 September 1993 New reference line for estimating roughness of an arbitrary curved surface
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156319
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
In this paper the authors deal emphatically with the problem of deciding the estimating reference of the roughness of an arbitrary curved surface and put forth a method of fitting its estimating reference with the polynomial ya+bx+cx (l By an analysis of a circular spheroid sample it has been proved that calculation using this model is both highly accurate and very convenient.
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Shaojun Xiao, Shaojun Xiao, Xiangqian Jiang, Xiangqian Jiang, Tie-Bang Xie, Tie-Bang Xie, "New reference line for estimating roughness of an arbitrary curved surface", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156319; https://doi.org/10.1117/12.156319
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