22 September 1993 Profile measurements using multi-gray-scale pattern projection
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156360
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
A novel optical profile measurement system has been developed using the multi-gray scale pattern projection. In the profile measurements, the time series space coding projection method is faster method than the slit projection method, the laser beam scanning method and so on. We applied the multi-gray scale (4 gray levels) fringe pattern and the image processing hardware on the time series space coding to reduce the number of projections and to speed up the measuring time. The series of tests show that the multi-gray scale projection sensor reliably ensures the 3-D profile of the machine parts as small as 0.2 mm in the measuring range 100 mm within 0.6 sec. It can be applied to measure 3-D profiles and 3-D environments for the moving robots.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kiyoshi Takamasu, Tetuo Uekawa, Kazuhiko Kawakami, Shigeo Ozono, Ryosyuu Furutani, "Profile measurements using multi-gray-scale pattern projection", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156360; https://doi.org/10.1117/12.156360
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