22 September 1993 Research on multifunction measurement device by laser diffraction
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156372
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
The measuring device by laser diffraction is described, It is used for measuring the Mean Spacing Sm of the Profile Irregularities, the Mean Spacing S of Local Peak of the Profile both are the parameters of the surface roughness standard, the feed rate f, the diameter of filament and the thickness of thin slice. Non-contact or on-line measurement could be realized by means of this device for measuring all parameters mentioned above (except thickness of thin slice). The device is characterized by adopting a diverging lens to expand the diffraction pattern, measuring and reading the separation of diffraction fringes using an electronic vernier calipers with numerical reading, thus reaching the purpose of measurement by means of lower precision electronic vernier calipers with numerical reading to deal with higher precision measurement.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
He Ma, Jian-Hua Yu, Cheng-Jun Wang, Hu-Chun Liu, "Research on multifunction measurement device by laser diffraction", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156372; https://doi.org/10.1117/12.156372
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