22 September 1993 Study of quality procedure control and metrological guarantee
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156404
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
In this paper, based on the opthmim design of procedure control, the authors propose a new concept, measurement capability index Mcp, give its defintion, and derive theoretically the quantitative relation between the rate of unqualified products of processing (index Pp) and Cp, and the quantitative relation between the misjudging rate of checking P mj and Cp, I4cp, meanwhile introduce the principle of comprehensive control of Pp and Pmj by Cp and Mcp.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chun-Yu Liang, Chun-Yu Liang, Li Ren, Li Ren, } "Study of quality procedure control and metrological guarantee", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156404; https://doi.org/10.1117/12.156404
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