22 September 1993 System design principle of linear CCD applied for measuring parts
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156412
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
In this paper, a new noncontact method is introduced in the measurement of part dimension. Several problems in the system design are analyzed such as the choices of CCD's elements, lens, irradiator and scan speed as well as their effect on resolution. KEYWORDS: Image, CCD, Measurement
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ling-Jing Tang, Ling-Jing Tang, Tuqiang Xie, Tuqiang Xie, } "System design principle of linear CCD applied for measuring parts", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); doi: 10.1117/12.156412; https://doi.org/10.1117/12.156412
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