30 August 1993 Far infrared reflectance standards
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Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210423 (1993) https://doi.org/10.1117/12.2298507
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
A method developed for the absolute determination of complex reflectivity is discussedin terms of reflection standards for the 3 to 600 cm-1 spectral region. These can beprimary standards based on transparent materials such as silicon, or secondary, opaquestandards such as thin aluminium films, with or without protective overcoating.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. R. Birch, J. R. Birch, } "Far infrared reflectance standards", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210423 (30 August 1993); doi: 10.1117/12.2298507; https://doi.org/10.1117/12.2298507
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