30 August 1993 Far infrared reflectance standards
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Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210423 (1993) https://doi.org/10.1117/12.2298507
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
A method developed for the absolute determination of complex reflectivity is discussedin terms of reflection standards for the 3 to 600 cm-1 spectral region. These can beprimary standards based on transparent materials such as silicon, or secondary, opaquestandards such as thin aluminium films, with or without protective overcoating.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. R. Birch, J. R. Birch, "Far infrared reflectance standards", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210423 (30 August 1993); doi: 10.1117/12.2298507; https://doi.org/10.1117/12.2298507
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