30 August 1993 Characterization of materials by submillimeter multibeam techniques
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Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210429 (1993) https://doi.org/10.1117/12.2298513
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
Use of different multilayer resonance structures in quasioptical submillimeter (SBMM) spectroscopy gives an•ffective way of increasing the sensitivity of measuring schemes due to multiple interaction of the testing radiationwith the sample. We present below three main kinds of interferometric structures used in SBMM quasiopticalspectroscopy which allow direct determination of any optical constant of the sample.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. P. Gorshunov, "Characterization of materials by submillimeter multibeam techniques", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210429 (30 August 1993); doi: 10.1117/12.2298513; https://doi.org/10.1117/12.2298513
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