30 August 1993 Characterization of microwave ceramics atsubmillimeter waves
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Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 21042A (1993) https://doi.org/10.1117/12.2298514
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
In this report we discuss the technique for dielectric characterization of microwave ceramics with the help ofsubmillimeter frequency-tunable monochromatic generators - backward-wave oscillators (BWO). We have devel- oped for frequencies 1011 - 1012 Hz (A - 3 - 0.3 mm) a technique for fast and precise measurement of the dielectriccharacteristics el and Ell of transparent ceramic samples. The techinique is aimed at determination of minimal levelof losses, connected with the fundamental infrared resonances of the crystal lattice [1, 2]. The measuring procedureconsists of recording in optical scheme of the transmissivity spectra of plane-parallel ceramic plates, working asFabry-Perot interferometers due to their high quality factors. The spectra of el and ell are determined on the basisof oscillating transmissivity curves using Fresnel formulas (Figs. 1,2).
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. A. Komandin, "Characterization of microwave ceramics atsubmillimeter waves", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 21042A (30 August 1993); doi: 10.1117/12.2298514; https://doi.org/10.1117/12.2298514
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