30 August 1993 Investigation of the electron distributionin CdxHg1-xTe superlattices by far infrared and Raman spectroscopy
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Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210438 (1993) https://doi.org/10.1117/12.2298548
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
Far infrared spectroscopy may be used in obtaining characterisation information on superlattices containingfree carriers; such information complements that obtained by Raman spectroscopy. This study makes use ofboth infrared and Raman measurements on CdxHgl_xTe (CMT) superlattice samples.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. K. Kang, S. K. Kang, "Investigation of the electron distributionin CdxHg1-xTe superlattices by far infrared and Raman spectroscopy", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210438 (30 August 1993); doi: 10.1117/12.2298548; https://doi.org/10.1117/12.2298548
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