Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media

J. R. Souza

doi:10.1117/12.2298583

30 August 1993 Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media

J. R. Souza

Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210447 (1993) https://doi.org/10.1117/12.2298583
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom

Abstract

The Spectral Domain Approach (SDA) is used for a rigorous full-wave analysis of thick microstrip linesembedded in lossy multilayered dielectric media. The effects of the conductor thickness on the propagationconstant and characteristic impedance are investigated.

Citation Download Citation

J. R. Souza "Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210447 (30 August 1993); https://doi.org/10.1117/12.2298583

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