30 August 1993 Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media
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Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210447 (1993) https://doi.org/10.1117/12.2298583
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
The Spectral Domain Approach (SDA) is used for a rigorous full-wave analysis of thick microstrip linesembedded in lossy multilayered dielectric media. The effects of the conductor thickness on the propagationconstant and characteristic impedance are investigated.
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J. R. Souza, J. R. Souza, "Frequency-dependent characteristics of thick microstrip lines in lossy multilayered dielectric media", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210447 (30 August 1993); doi: 10.1117/12.2298583; https://doi.org/10.1117/12.2298583
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