30 November 2017 Far infrared ellipsometric study of HTSC gap in ab- and c-oriented epitaxial YBaCuO films
Author Affiliations +
Proceedings Volume 2104, 18th International Conference on Infrared and Millimeter Waves; 210485 (2017) https://doi.org/10.1117/12.2298725
Event: 18th International Conference on Infrared and Millimeter Waves, 1993, Colchester, United Kingdom
Abstract
To test different models of HTSC and to study mechanism of this phenomenon comparison of themeasured complex dielectric function e(w, T) and of the computed one is very useful. In the case ofanisotropic substance, such as Y Ba2Cu307, e(w, T) is tenzor with different ca, cb, ec components. However,the structure of oriented YBaCuO films permits to determine ec and only averaged cab value. To carryout ellipsometric measurements on small samples in far IR the light beam should be focused onto thesample surface. Earlier we find an original decision of the direct problem of convergent beam ellipsometryl(CBE). This report is devoted to the inverse problem of CBE for the following reflecting system: 1-axisanisotropic film on isotropic substrate. By this technique we have obtained temperature dependencies (4— 300 K) of Cab and c, at fixed laser frequencies 84, 120, 357 cm-1.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. B. Sushkov, "Far infrared ellipsometric study of HTSC gap in ab- and c-oriented epitaxial YBaCuO films", Proc. SPIE 2104, 18th International Conference on Infrared and Millimeter Waves, 210485 (30 November 2017); doi: 10.1117/12.2298725; https://doi.org/10.1117/12.2298725
PROCEEDINGS
2 PAGES


SHARE
Back to Top