10 December 1993 Open test and measurement systems application in holography and optics
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Proceedings Volume 2108, International Conference on Holography, Correlation Optics, and Recording Materials; (1993) https://doi.org/10.1117/12.165433
Event: Holography, Correlation Optics, and Recording Materials, 1993, Chernivsti, Ukraine
Abstract
The Open Test and Measurement Systems (OTMS) conception and generalized OTMS model are discussed in this paper. The following levels are defined in the model: object, physical, data, application, and manufacturing. VXIbus based OTMS realization and its benefits are discussed concerning applications for integral optics and golography.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yury V. Demchenko, Yury V. Demchenko, Mikhael M. Semerenko, Mikhael M. Semerenko, } "Open test and measurement systems application in holography and optics", Proc. SPIE 2108, International Conference on Holography, Correlation Optics, and Recording Materials, (10 December 1993); doi: 10.1117/12.165433; https://doi.org/10.1117/12.165433
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