Diagnostics of multilayer dielectric coating based on reflection and transmission spectra

Yury A. Pervak; Ishtvan V. Fekeshgazi

doi:10.1117/12.192002

31 October 1994 Diagnostics of multilayer dielectric coating based on reflection and transmission spectra

Yury A. Pervak, Ishtvan V. Fekeshgazi

Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.192002
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine

Abstract

The various optical components with dielectrical coatings (mirrors, anti-reflection coatings, filters, polarizing and dichroic splitters, etc.) are used broadly in the quantum electronic, laser technique and other branches of optical instrument making. The successful designing of the multi-layer coatings with definite spectral and physicochemical properties are dependent on the authenticity of the parameters of the individual layers. It is known that considerable information about peculiarity of the coating design may be gotten by the measuring of the refractive, transmission and absorption spectra. At this report the results of the investigation of the refractive spectra of multi-layer dielectrical mirrors with symmetrical periods are presented and possibilities of the diagnostic of the structure and some parameters of the individual layers are shown.

Citation Download Citation

Yury A. Pervak and Ishtvan V. Fekeshgazi "Diagnostics of multilayer dielectric coating based on reflection and transmission spectra", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); https://doi.org/10.1117/12.192002

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