31 October 1994 Luminescence profiling: a diagnostic method for an impurities-defects system in semiconductor materials
Author Affiliations +
Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.191975
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine
Abstract
In this paper a new method of impurities defect interaction monitoring by analyzing the low temperature many-bands photoluminescence spectra (PL) under the nonuniform external perturbation of the defect system is presented. As an example a PL spectra of cadmium telluride monocrystal plates after annealing in evacuated ampoule, cadmium and gallium atmosphere are discussed versus a coordinate of diffusion. The same well known background impurities such as Cu, Li, P and their complexes with native defects were studied under non- uniform deviation from stoichiometric composition of material toward the sample thickness.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir N. Babentsov, Aleksandr I. Vlasenko, N. I. Tarbaev, "Luminescence profiling: a diagnostic method for an impurities-defects system in semiconductor materials", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); doi: 10.1117/12.191975; https://doi.org/10.1117/12.191975
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT

Spectrally Filtered Cathodoluminescence Of CdTe
Proceedings of SPIE (April 22 1987)
Compensation in semi-intrinsic CdTe-based materials
Proceedings of SPIE (February 22 2001)
MBE Growth Of CdTe And ZnCdTe On GaAs Substrates
Proceedings of SPIE (November 22 1986)
Regularities of the CdxHg1 xTe p n junction formation by...
Proceedings of SPIE (September 29 2005)
Modification of band gap in surface layer in Cd1 xZnxTe...
Proceedings of SPIE (January 25 2007)

Back to Top