Method and measuring device for micro-optics element assessment

Alexander V. Bondarenko; Konstantin G. Predko

doi:10.1117/12.191992

31 October 1994 Method and measuring device for micro-optics element assessment

Alexander V. Bondarenko, Konstantin G. Predko

Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.191992
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine

Abstract

In this paper, a method is proposed for determination of the performance of such optical and photo-optical systems as lenses with graded-index profiles, focusing optical fibers and micro- lenses. A device, characterized by its simplicity, for modulation or optical transfer functions measurements is described. Some micro-optical elements are evaluated by means of the suggested method and the device.

Citation Download Citation

Alexander V. Bondarenko and Konstantin G. Predko "Method and measuring device for micro-optics element assessment", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); https://doi.org/10.1117/12.191992

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available