31 October 1994 Solid state surface spectroscopy using the ellipsometric characteristics of guided-wave and surface polaritons
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Proceedings Volume 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics; (1994) https://doi.org/10.1117/12.191968
Event: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop, 1993, Kiev, Ukraine
Abstract
A new method is proposed for studying surfaces in the region of resonance interaction of electromagnetic radiation with surface elementary excitations. In this method the sample surface is illuminated through the ATR prism having a thin metallic layer on its base and ellipsometric angles of reflected beam are measured. We have studied ellipsometric parameters and sensitivity of GWP ellipsometry in measuring refraction and absorption indices at the surface. A substantial bettering of sensitivity was demonstrated.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
I. I. Burshta, I. I. Burshta, Evgenie F. Venger, Evgenie F. Venger, S. N. Zavadskii, S. N. Zavadskii, } "Solid state surface spectroscopy using the ellipsometric characteristics of guided-wave and surface polaritons", Proc. SPIE 2113, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (31 October 1994); doi: 10.1117/12.191968; https://doi.org/10.1117/12.191968
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