16 May 1994 Ultrafast scanning probe microscopy
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We have developed a general technique that combines the temporal resolution of ultrafast laser spectroscopy with the spatial resolution of scanned probe microscopy (SPM). Using this technique with scanning tunneling microscopy (STM), we have obtained simultaneous 2 ps time resolution and 50 angstrom spatial resolution. This improves the time resolution currently attainable with STM by nine orders of magnitude. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution is discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Botkin, David Botkin, Shimon Weiss, Shimon Weiss, D. Frank Ogletree, D. Frank Ogletree, Miguel Salmeron, Miguel Salmeron, Daniel S. Chemla, Daniel S. Chemla, "Ultrafast scanning probe microscopy", Proc. SPIE 2116, Generation, Amplification, and Measurement of Ultrashort Laser Pulses, (16 May 1994); doi: 10.1117/12.175874; https://doi.org/10.1117/12.175874

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