Pulsed IR-FEL applications for the characterization of infrared optical materials

Richard Mu; Don Otto Henderson; J. Bruce Johnson; Glenn S. Edwards

doi:10.1117/12.181347

27 July 1994 Pulsed IR-FEL applications for the characterization of infrared optical materials

Richard Mu, Don Otto Henderson, J. Bruce Johnson, Glenn S. Edwards

Proceedings Volume 2138, Longer Wavelength Lasers and Applications; (1994) https://doi.org/10.1117/12.181347
Event: OE/LASE '94, 1994, Los Angeles, CA, United States

Abstract

Theoretical considerations of thermal lens effect due to linear and nonlinear optical absorption is presented. Based on this model, Z-scan technique, especially two-color Z-scan due can be used to detect very low level of impurities or defects in optical materials. Depending upon the optical cross section of the particular species being probed, two-color Z-scan can detect impurities, for example, the OH groups in fused silica at sub-ppm level by weight or better.

Citation Download Citation

Richard Mu, Don Otto Henderson, J. Bruce Johnson, and Glenn S. Edwards "Pulsed IR-FEL applications for the characterization of infrared optical materials", Proc. SPIE 2138, Longer Wavelength Lasers and Applications, (27 July 1994); https://doi.org/10.1117/12.181347

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