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Characterization by line-shape analysis of photoreflectance spectra for modulation-doped strained quantum wells
Reflection high-energy electron diffraction studies of epitaxial growth on corrugated semiconductor surfaces
Correlation of optical, x-ray, and electron microscopy measurements on semiconductor multilayer structures
Electroreflectance line-shape analysis for coupled GaAs-AlAs superlattices in strong electric fields
Optical study of lift-off multiple quantum well thin films under various types of thermally induced in-plane strain
Spectroscopic ellipsometry of undulated, bonded silicon-on-insulator structures with oxide-nitride-oxide layers