15 May 1994 Determination of the dispersion of linear and quadratic electro-optic coefficients in thin films by electric field-induced modulated ellipsometry
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Abstract
An experimental method enabling a simultaneous determination of the linear and quadratic electro-optic coefficients in thin film is described. The technique is based on the interference between electric field induced modulation of transverse electric (TE) and transfer magnetic (TM) fields propagating through a stratified medium consisting on a substrate, semitransparent electrode, and the measured thin film. It allows us to determine both the real and the imaginary parts of corresponding electro-optic coefficients as well as their dispersion. The use of thin film enables both electro-optic coefficients measurements in the thin film absorption band allowing nonlinear spectroscopy studies. The technique is applied to a poled functionalized polymer thin film and the results are interpreted in terms of a two level model. This allows a determination of microscopic parameters such as: excited and fundamental state permanent dipole moment difference and transition moment between fundamental and first excited state. A presence of an excited state in the bottom of the absorption band is revealed.
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Pierre-Alain Chollet, Pierre-Alain Chollet, Gregory Gadret, Gregory Gadret, Francois Kajzar, Francois Kajzar, Paul Raimond, Paul Raimond, } "Determination of the dispersion of linear and quadratic electro-optic coefficients in thin films by electric field-induced modulated ellipsometry", Proc. SPIE 2143, Organic, Metallo-Organic, and Polymeric Materials for Nonlinear Optical Applications, (15 May 1994); doi: 10.1117/12.173834; https://doi.org/10.1117/12.173834
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