1 June 1994 Strategy for reliability qualification of nonhermetic laser modules
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Abstract
The availability of a reliable, non-hermetic InP based laser and associated monitor diode could provide the cost reduction needed for wide spread use of such lasers for two way broad band communication. Since there is little information available in the reliability of such devices in non-hermetic packages, a strategy for carrying out life testing in humid environments is presented. Accelerated aging tests can be used to assess the reliability of presently available devices and to discover the failure modes. Detailed failure analysis provides understanding of the physics and chemistry of the failure mechanism and leads to design and material improvements to prevent these failure mechanisms. The basic assumption underlying accelerated testing and the physical basis for the derivation of acceleration factors are discussed. Proper design of the accelerated test and selection of test conditions are essential for the derivation of useful temperature and humidity acceleration factors. These acceleration factors are determined from analyses of the time-to-failure as a function of both parameters. Finally, the possibility of condensation and its effects on a laser-monitor assembly are discussed.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John W. Osenbach, John W. Osenbach, Robert B. Comizzoli, Robert B. Comizzoli, } "Strategy for reliability qualification of nonhermetic laser modules", Proc. SPIE 2148, Laser Diode Technology and Applications VI, (1 June 1994); doi: 10.1117/12.176635; https://doi.org/10.1117/12.176635
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