2 May 1994 Modern high-speed measurement techniques
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Proceedings Volume 2149, Technologies for Optical Fiber Communications; (1994); doi: 10.1117/12.175248
Event: OE/LASE '94, 1994, Los Angeles, CA, United States
Abstract
Today's high-speed electronic devices and networks challenge the capabilities of commercially available test instrumentation. Modern techniques using ultrashort light pulses and electron beams are now routinely used to characterize these fast circuits but are not without their limitations. In this paper I discuss the performance characteristics common to all these measurement techniques and compare some of them in a context that will be applicable to future techniques as they develop.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian H. Kolner, "Modern high-speed measurement techniques", Proc. SPIE 2149, Technologies for Optical Fiber Communications, (2 May 1994); doi: 10.1117/12.175248; https://doi.org/10.1117/12.175248
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KEYWORDS
Signal detection

Electro optics

Crystals

Receivers

Interference (communication)

Electron beams

Semiconductors

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