2 May 1994 Analysis on link failures in free-space optical interconnects
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Proceedings Volume 2153, Optoelectronic Interconnects II; (1994) https://doi.org/10.1117/12.174531
Event: OE/LASE '94, 1994, Los Angeles, CA, United States
Abstract
Free space optical interconnect has provided a promising solution to the effective signal links of the increasing density and complexity in very-large-scale/large-scale integrated circuits. It is getting less affordable if such a system fails just for one tiny physical defect. Our analysis on the potential optical-electrical link failure provides guidelines for future testing and reliable system design. The study of fault models starts by exploring the underlying physical malfunctioning of the opto-electrical components, and their impacts on the assembled systems. We map the physical defects of opto-electronic devices into their corresponding logic-level representation for higher level design consideration. This mapping is chosen for its compatibility and practicability with digital electronic system designs where automated design tools can expedite the design optimization and verification process.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Huoy-Yu Liou, Huoy-Yu Liou, Ting-Ting Lin, Ting-Ting Lin, } "Analysis on link failures in free-space optical interconnects", Proc. SPIE 2153, Optoelectronic Interconnects II, (2 May 1994); doi: 10.1117/12.174531; https://doi.org/10.1117/12.174531
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