4 January 1994 Dielectric properties of thin-film SrTiO3 grown on LaAlO3 with YBa2Cu3O7-x electrodes
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Abstract
We have fabricated and characterized YBCO (YBa2Cu3O7-x) microstrip resonators on LAO (LaAlO3) substrates that include thin film STO (SrTiO3) coplanar capacitors to study the dielectric properties of thin film STO. The low frequency capacitance of the STO/LAO capacitor is measured as a function of temperature and dc bias. We use the observed resonant frequencies to extract the microwave frequency capacitance of the structure and the Qs to determine the microwave losses. A conformal map is developed and used to transform the observed capacitances into dielectric constant values for the thin film STO.
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Huey-Daw Wu, Huey-Daw Wu, Frank S. Barnes, Frank S. Barnes, David Galt, David Galt, John C. Price, John C. Price, James A. Beall, James A. Beall, } "Dielectric properties of thin-film SrTiO3 grown on LaAlO3 with YBa2Cu3O7-x electrodes", Proc. SPIE 2156, High Tc Microwave Superconductors and Applications, (4 January 1994); doi: 10.1117/12.166149; https://doi.org/10.1117/12.166149
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