20 May 1994 Superconducting YBa2Cu3O7 bolometer on polycrystalline diamond
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We have deposited superconducting YBCO (YBa2Cu3O7) thin films on polycrystalline diamond using a composite Si/YSZ (yttria stabilized zirconia) diffusion barrier. 10 - 20 micron thick, free standing diamond films were coated with a micron thick layer of amorphous Si by plasma CVD. This was vacuum annealed at 700 degree(s)C to crystallize Si prior to the in-situ deposition of YSZ and YBCO by laser ablation. A primary layer of Si was found essential to avoid the peeling of the multilayer structure during the cooling of the substrates. A Tc-zero equals 50 K was observed for the best films. A bolometer fabricated from this film exhibited a 18 V/W responsivity and NEP equals 6.3 X 10-9 W/(root)Hz at 60 K. Both the buffer layers and YBCO were polycrystalline. We believe single crystal Si backing CVD grown diamond can be used instead of a polycrystalline Si layer to further improve the quality of the YBCO deposited on polycrystalline diamond.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Laxminarayana Ganapathi, Laxminarayana Ganapathi, Jim P. Zheng, Jim P. Zheng, Steven E. Giles, Steven E. Giles, Rama Rao, Rama Rao, HoiSing Kwok, HoiSing Kwok, } "Superconducting YBa2Cu3O7 bolometer on polycrystalline diamond", Proc. SPIE 2159, High-Temperature Superconducting Detectors: Bolometric and Nonbolometric, (20 May 1994); doi: 10.1117/12.176149; https://doi.org/10.1117/12.176149

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