31 December 1993 Comparison of absolute values of diffuse reflection spectral factor obtained by various methods
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Proceedings Volume 2161, CIS Selected Papers: Photometry; (1993) https://doi.org/10.1117/12.166386
Event: Photometry: Selected Papers from the 8th and 9th CIS Conferences, 1992, Moscow, Russian Federation
Abstract
In the USSR there are two absolute methods of measuring the diffuse reflection spectral factors realized in two high-precision ethalon devices. Hence the unity of measurements requires the comparison of the measurement data obtained from these two devices. This work presents the results of comparisons of these two ethalon devices. We also describe the peculiarity of other main methods for absolute measurements of the diffuse reflection spectral factor.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. V. Novitski, A. V. Novitski, V. K. Vertushkin, V. K. Vertushkin, A. M. Uljanov, A. M. Uljanov, } "Comparison of absolute values of diffuse reflection spectral factor obtained by various methods", Proc. SPIE 2161, CIS Selected Papers: Photometry, (31 December 1993); doi: 10.1117/12.166386; https://doi.org/10.1117/12.166386
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