New device for measuring residual stress in optical elements

M. Y. Sahnovsky; O. A. Semiv; S. V. Skolozdra; J. M. Serbunov; B. M. Timochko

doi:10.1117/12.166374

31 December 1993 New device for measuring residual stress in optical elements

M. Y. Sahnovsky, O. A. Semiv, S. V. Skolozdra, J. M. Serbunov, B. M. Timochko

Proceedings Volume 2161, CIS Selected Papers: Photometry; (1993) https://doi.org/10.1117/12.166374
Event: Photometry: Selected Papers from the 8th and 9th CIS Conferences, 1992, Moscow, Russian Federation

Abstract

A number of devices for residual stress monitoring in glass and other transparent optical media consisting of an illuminator and a registering part are known. Use of these devices makes it impossible to determine the residual inner stress in a transparent sample, the back side of which is covered with a mirror reflecting coating. The device we propose is able to make the final testing. The new instrument allows us to measure the residual stress either in samples that are transparent for probing radiation or in transparent for probing radiation objects, the rear side of which are covered with the reflecting coating. It is achieved in the following way: at a measuring residual stress in reflecting objects the recording part of the device may be located in the same half-space with the illuminator and receiver the radiation, reflected by the coating.

Citation Download Citation

M. Y. Sahnovsky, O. A. Semiv, S. V. Skolozdra, J. M. Serbunov, and B. M. Timochko "New device for measuring residual stress in optical elements", Proc. SPIE 2161, CIS Selected Papers: Photometry, (31 December 1993); https://doi.org/10.1117/12.166374

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