Measurement of noise and resolution in x-ray computed microtomograms

Michael J. Flynn; David A. Reimann; Sean M. Hames

doi:10.1117/12.174256

1 May 1994 Measurement of noise and resolution in x-ray computed microtomograms

Michael J. Flynn, David A. Reimann, Sean M. Hames

Proceedings Volume 2163, Medical Imaging 1994: Physics of Medical Imaging; (1994) https://doi.org/10.1117/12.174256
Event: Medical Imaging 1994, 1994, Newport Beach, CA, United States

Abstract

X-ray microcomputed tomograms with resolution of 50 microns or better have been obtained at several research centers by using either synchrotron or microfocus x-ray sources. Full 3D reconstructions have been obtained in these laboratories on specimens or small animals. In our laboratory we have studied embedded bone specimens by using x-ray cone beam microtomography-methods. For conventional, medical x-ray computed tomography systems, well accepted techniques and standards exist for characterizing the performance of an instrument. No comparable standards exist for computed microtomography and previous publications are vague with respect to the performance achieved. We report in this paper the experimental methods that we have developed to measure noise and resolution in our microtomography laboratory and the specific performance characteristics we have achieved.

Citation Download Citation

Michael J. Flynn, David A. Reimann, and Sean M. Hames "Measurement of noise and resolution in x-ray computed microtomograms", Proc. SPIE 2163, Medical Imaging 1994: Physics of Medical Imaging, (1 May 1994); https://doi.org/10.1117/12.174256

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