1 May 1994 Evaluation of a charge injection device array
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A Charge Injection Device Technologies 512 X 512 CID array has been tested at liquid nitrogen temperature to assess its suitability for use in low light applications. The CID-38 chip used was installed in a SICam dewar/electronics from CIDTEC. For this particular system the noise floor was measured to be approximately equals 260 electrons rms for a single readout. Using the nondestructive readout option an approximately equals (root)N, where N is the number of readouts, improvement in this noise figure can be achieved. The average dark current at 77 degree(s)K was not measurable in a three-hour dark integration.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zoran Ninkov, Zoran Ninkov, Chen Tang, Chen Tang, Roger L. Easton, Roger L. Easton, } "Evaluation of a charge injection device array", Proc. SPIE 2172, Charge-Coupled Devices and Solid State Optical Sensors IV, (1 May 1994); doi: 10.1117/12.172761; https://doi.org/10.1117/12.172761

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