Paper
1 April 1994 Electrical characterization of blue electroluminescent devices
Long V. Pham, John F. Wager, Sey-Shing Sun, Eric Dickey, Richard T. Tuenge, Christopher N. King
Author Affiliations +
Proceedings Volume 2174, Advanced Flat Panel Display Technologies; (1994) https://doi.org/10.1117/12.172144
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States
Abstract
A new class of blue thin-film electroluminescent (TFEL) devices based on thiogallate phosphors has been reported recently. The purpose of this work reported herein is to compare and contrast the electrical properties of CaGa2S4:Ce TFEL blue phosphor devices to those of conventional evaporated ZnS:Mn TFEL devices. Capacitance-voltage (C-V) and internal charge-phosphor field (Q-Fp) techniques are employed for electrical characterization.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Long V. Pham, John F. Wager, Sey-Shing Sun, Eric Dickey, Richard T. Tuenge, and Christopher N. King "Electrical characterization of blue electroluminescent devices", Proc. SPIE 2174, Advanced Flat Panel Display Technologies, (1 April 1994); https://doi.org/10.1117/12.172144
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Cited by 6 scholarly publications.
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KEYWORDS
Capacitance

Interfaces

Aluminum

Polarization

Thin film devices

Dielectric polarization

Resistors

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