Modeling and analyses of the Voltage Imaging Tm spatial resolution

Ying-Moh Liu; Lon H. Chu; David Yushan Fong

doi:10.1117/12.171079

23 March 1994 Modeling and analyses of the Voltage Imaging Tm spatial resolution

Ying-Moh Liu, Lon H. Chu, David Yushan Fong

Proceedings Volume 2182, Image and Video Processing II; (1994) https://doi.org/10.1117/12.171079
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States

Abstract

The spatial resolution of the Voltage Imaging^TM technology is defined as the smallest pixel pitch that can be measured for a certain voltage accuracy. It is a function of the EO material, the image forming optics, the CCD resolution and electronic filter bandwidth, and the image processor resolution and filter bandwidth. This paper starts from a square wave input signal with 100% modulation on the LCD panel. The contrast transfer function (CTF) for each individual stage in the voltage imaging process is derived. They include the EO material, the objective lens and imaging lens, the CCD camera spatial sampling, the CCD camera electronics filtering, and the image processor sampling and filtering. Simulated data is presented.

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Ying-Moh Liu, Lon H. Chu, and David Yushan Fong "Modeling and analyses of the Voltage Imaging Tm spatial resolution", Proc. SPIE 2182, Image and Video Processing II, (23 March 1994); https://doi.org/10.1117/12.171079

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KEYWORDS

Image processing

Image filtering

Charge-coupled devices

Optical filters

CCD cameras

Video processing

LCDs

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