11 March 1994 Diffraction pattern analysis for automatic defect classification in manufactured electronic assemblies
Author Affiliations +
Abstract
A technique for the quality assessment of fine-pitch electronic components is described. A system for the capture of Fraunhofer diffraction patterns reflected from the component is presented. The processing of the image to enable classification by a neural network is discussed. Simulation results are presented, showing the feasibility of the technique.
© (1994) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Search, Clifford Allan Hobson, John T. Atkinson, Jeremy David Pearson, "Diffraction pattern analysis for automatic defect classification in manufactured electronic assemblies", Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); doi: 10.1117/12.171222; https://doi.org/10.1117/12.171222
PROCEEDINGS
10 PAGES


SHARE
KEYWORDS
Diffraction

Lead

Inspection

Far-field diffraction

Reflectivity

Image classification

Manufacturing

Back to Top