Reference-based automatic visual inspection of electronic packaging using a parallel image processing system

Alan D. Dorundo; Jon R. Mandeville; Frederick Y. Wu

doi:10.1117/12.171224

11 March 1994 Reference-based automatic visual inspection of electronic packaging using a parallel image processing system

Alan D. Dorundo, Jon R. Mandeville, Frederick Y. Wu

Author Affiliations +

Proceedings Volume 2183, Machine Vision Applications in Industrial Inspection II; (1994) https://doi.org/10.1117/12.171224
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States

Abstract

We introduce the Advanced Thin Film Inspection System (ATFIS), a state-of-the-art automatic visual inspection (AVI) system developed by IBM that integrates sophisticated subsystems to inspect advanced multilayer electronic packaging. The image acquisition and 'image segmentation' (material discrimination) is based on a high-radiance illumination, multiband line scan cameras and the Low-level Image Segmentation Architecture (LISA). LISA employs a decision-theoretic approach that classifies pixels according to a decision function defined over a multidimensional 'feature space' (for example, local or global image statistics). The image processing and pattern analysis is based on the Parallel Image Processing System for Inspection (PIPSI) architecture. PIPSI's key features include exploitation of emerging hardware and software technologies; highly programmable to adapt quickly to changing functional requirements; and exploitation of image and operator parallelism, making it highly scalable to meet manufacturing requirements. The pattern analysis algorithm is a synthesis of reference-based comparison and design-rule analysis.

Citation Download Citation

Alan D. Dorundo, Jon R. Mandeville, and Frederick Y. Wu "Reference-based automatic visual inspection of electronic packaging using a parallel image processing system", Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); https://doi.org/10.1117/12.171224

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